期刊
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
卷 152, 期 1-3, 页码 125-131出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.mseb.2008.06.004
关键词
Thin films; Polymers; Organic monolayers; Surface optics; Surface structure; Surface morphology
We present the results of a feasibility study of the capabilities of scanning white light interferometry (SWLI) to map large (macroscopic) areas of thin and Ultrathin organic films deposited on mica and borosilicate glass substrates. We have shown that SWLI can provide useful characteristics (Such as thickness and homogeneity) of polymer monolayers and surface patterns prepared by microcontact printing. We present the principle of operation of the technique and discuss the conditions under which SWLI can give reliable results, its strengths and its limitations. (C) 2008 Elsevier B.V. All rights reserved.
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