4.7 Article

Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti-6Al-4V alloy

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2010.10.025

关键词

In situ straining; Transmission electron microscopy (T'EM); Focused ion beam (FIB); Dislocation dynamics; Titanium alloy; Nitridation

向作者/读者索取更多资源

The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy. (C) 2010 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据