期刊
出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2008.02.059
关键词
NiTi shape-memory alloys; Pseudoelasticity; Fatigue; In situ SEM; Stents; UFG
In the present study we characterize the microstructure of pseudoelastic, ultra-fine grained, Ni-rich NiTi-stents using transmission electron microscopy (TEM) and perform structural fatigue experiments. The TEM-samples were taken from small struts, the elementary building units of medical stents. They were prepared using a focused ion beam (FIB) system. Microstents were subjected to approximately 6000 cycles at room temperature in air at a frequency of 1 Hz. They were then integrated into an in situ test rig which allowed to perform cyclic tensile loading in a scanning electron microscope (SEM). The present paper reports the stress-strain response associated with cyclic loading and documents failure mechanisms. (C) 2008 Elsevier B.V. All rights reserved.
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