The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

High-resolution X-ray diffraction (XRD) line-profile analysis was used to characterize slip activity and twinning in commercial-purity titanium (CP-Ti) during hot rolling. The effect of {10.1} and {10.2} twins on XRD patterns was deduced using the DIFFAX software. The density of twin boundaries was then incorporated into the XRD pattern-fitting procedure for evaluating dislocation densities, slip activity, and subgrain size. It was found that < a > and < c +a > type slip occurred during hot rolling. The X-ray data revealed 0.07(+/- 0.02)% twin-boundary frequency for the {10.2} twin family, but zero twinning (within the experimental accuracy) in the {10.1} family. Electron backscatter diffraction (EBSD) data confirmed the X-ray findings. (c) 2007 Elsevier B.V. All rights reserved.