4.6 Article

Structural and optical evolution of Ga2O3/glass thin films deposited by radio frequency magnetron sputtering

期刊

MATERIALS LETTERS
卷 123, 期 -, 页码 160-164

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ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2014.03.038

关键词

Ga2O3; Nanowire; Optical bandgap; Refractive index; RF sputtering

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We investigated the structural and optical evolution of Ga2O3 thin films on glass substrates deposited using radio frequency magnetron sputtering. Initially, amorphous Ga2O3 thin film is grown, and then, surface humps and nanowire (NW) bundles are gradually formed as the film thickness increases. The surface humps are Ga-rich and provide nucleation sites for NWs through a self-catalytic vapor-liquid-solid mechanism with self-assembled Ga droplets. Both the surface humps and the NWs induce variation of the optical properties such as the optical bandgap and refractive index by absorbing light in the ultraviolet region. (c) 2014 Elsevier B.V. All rights reserved.

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