4.6 Article

Local electronic structure of ZnO nanorods grown by radio frequency magnetron sputtering

期刊

MATERIALS LETTERS
卷 116, 期 -, 页码 206-208

出版社

ELSEVIER
DOI: 10.1016/j.matlet.2013.11.034

关键词

ZnO nanorods; Sputtering; X-ray diffraction; X-ray absorption spectroscopy

资金

  1. Department of Science and Technology (DST), Government of India [SR/NM/NS-77/2008]
  2. Council of Scientific and Industrial Research (CSIR), Government of India

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We report the structural properties and local electronic structure of vertically aligned ZnO nanorods fabricated on silicon substrate without external catalyst by radio frequency magnetron sputtering. X-ray diffraction and morphological studies reveal the hexagonal wurtzite crystal structure with preferential orientation along the (002) crystallographic plane and vertical alignment of the ZnO nanorods. Angle dependent X-ray absorption near-edge spectroscopy measurements of the vertically aligned ZnO nanorods at O K and Zn L-edges divulge that the tip and side wall surfaces of the nanorods are terminated by the oxygen and zinc ions respectively. (C) 2013 Elsevier B.V. All rights reserved.

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