期刊
MATERIALS CHEMISTRY AND PHYSICS
卷 130, 期 1-2, 页码 702-707出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2011.07.048
关键词
Polymers; Ion implantation; Radiation damage; Raman spectroscopy and scattering
In this work we determined depth profiles of the chemical change in PMMA irradiated with 2 MeV protons by infrared spectroscopic and micro-Raman measurements. The measurements were carried out on 10 mu m thin stacked foil samples using an infrared spectrometer in universal attenuated total reflectance (UATR) and transmission modes; while the thick samples were analyzed with a confocal micro-Raman spectrometer. The depth profiles of the changes formed due to the various delivered fluences were compared to each other. The measurements show the strong dependence of the degree of modification on the energy transfer from the decelerating protons. Depth profiles reveal that at the fluences applied in this work the entire irradiated volume suffered some chemical modifications. In case of low-fluence samples the zone of maximal modification is restricted only to the Bragg peak, but with increasing fluences the region of maximal modification extends towards the sample surface. (C) 2011 Elsevier B.V. All rights reserved.
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