4.6 Article

Ultraviolet photodetectors fabricated from ZnO p-i-n homojunction structures

期刊

MATERIALS CHEMISTRY AND PHYSICS
卷 129, 期 1-2, 页码 27-29

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2011.04.058

关键词

Thin films; Molecular beam epitaxy; Electronic characterization; Optical properties

资金

  1. National Basic Research Program of China [2011CB302005, 2011CB302006]
  2. Chinese Academy of Sciences
  3. Natural Science Foundation of China [11074248, 1097497, 10874178, 60806002]

向作者/读者索取更多资源

Zinc oxide (ZnO) p-i-n structured ultraviolet (UV) photodetector has been constructed in this paper. The photodetector exhibits an obvious response to ultraviolet light at 0 V bias, which is a typical character of p-i-n structured photodetectors. The maximum responsivity of the photodetector, which is located at around 390 nm, is about 0.45 mA W-1 at 0 V bias, and the responsivity increases with increasing reverse bias voltage applied. The response decay time of the p-i-n structured photodetector is about 260 ns. This is the first report on ZnO p-i-n homojunction structured photodetectors to the best of our knowledge. Considering that p-i-n structure is the most promising configuration for high performance photodetectors, the results reported in this paper may provide a clue for high-performance ZnO based UV photodetectors. (C) 2011 Elsevier B.V. All rights reserved.

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