期刊
MATERIALS CHARACTERIZATION
卷 86, 期 -, 页码 190-199出版社
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2013.09.011
关键词
Microstructure Defects; X-ray diffraction; Line broadening; Transmission electron microscopy; Hexagonal BN
类别
资金
- Dr. Erich Kruger Foundation of the TU Bergakademie Freiberg
- European Union (European Regional Development Fund)
- Ministry of Science and Art of Saxony (SMWK)
A routine for simultaneous quantification of turbostratic disorder, amount of puckering and the dislocation and stacking fault density in hexagonal materials was proposed and tested on boron nitride powder samples that were synthesised using different methods. The routine allows the individual microstructure defects to be recognised according to their effect on the anisotropy of the X-ray diffraction line broadening. For quantification of the microstructure defects, the total line broadening is regarded as a linear combination of the contributions from the particular defects. The total line broadening is obtained from the line profile fitting. As testing material, graphitic boron nitride (h-BN) was employed in the form of hot-isostatically pressed h-BN, pyrolytic h-BN or a h-BN, which was chemically vapour deposited at a low temperature. The kind of the dominant microstructure defects determined from the broadening of the X-ray diffraction lines was verified by high resolution transmission electron microscopy. Their amount was attempted to be verified by alternative methods. (C) 2013 Elsevier Inc. All rights reserved.
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