期刊
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
卷 21, 期 1, 页码 112-116出版社
SPRINGER
DOI: 10.1016/j.jasms.2009.09.011
关键词
-
资金
- Stevens Institute of Technology
Facile generation of series of singly charged radical anions (S-n(-center dot); n = 1-15) and cations (S-n(+center dot); n = 2-11) by direct laser ionization renders elemental sulfur an excellent material for the low-mass-region calibration of time of flight (TOF) mass spectrometers. Upon irradiation by a 337-nm UV laser, elemental sulfur undergoes facile ionization without the need of an additional laser-absorbing matrix. An intense and evenly spaced set of peaks is obtained in both modes. (J Am Soc Mass Spectrom 2010, 21, 112-116) (C) 2010 Published by Elsevier Inc. on behalf of American Society for Mass Spectrometry
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