4.8 Article

Nitrogen-Doped Graphene Nanoplatelets from Simple Solution Edge-Functionalization for n-Type Field-Effect Transistors

期刊

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
卷 135, 期 24, 页码 8981-8988

出版社

AMER CHEMICAL SOC
DOI: 10.1021/ja402555n

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资金

  1. World Class Research (WCU)
  2. Converging Research Center (CRC)
  3. Mid-Career Researcher (MCR)
  4. Basic Research Laboratory (BRL)
  5. US-Korea NBIT
  6. Basic Science Research
  7. UNIST-Samsung OLED Center
  8. Global Frontier Research Center for Advanced Soft Electronics Projects through National Research Foundation (NRF) from the Ministry of Education, Science and Technology (MEST) in Korea
  9. Global Ph.D. Fellowship
  10. NRF
  11. AFOSR [FA 9550-10-1-0546, FA9550-12-1-0037]

向作者/读者索取更多资源

The development of a versatile method for nitrogen-doping of graphitic structure is an important challenge for many applications, such as energy conversions and storages and electronic devices. Here, we report a simple but efficient method for preparing nitrogen-doped graphene nanoplatelets via wet-chemical reactions. The reaction between monoketone (C=O) in graphene oxide (GO) and monoamine-containing compound produces imine (Shiff base) functionalized GO (iGO). The reaction between alpha-diketone in GO and 1,2-diamine (ortho-diamine)-containing compound gives stable pyrazine ring functionalized GO (pGO). Subsequent heat-treatments of iGO and pGO result in high-quality, nitrogen-doped graphene nanoplatelets to be designated as hiGO and hpGO, respectively. Of particular interest, hpGO was found to display the n-type field-effect transistor behavior with a charge neutral point (Dirac point) located at around 16 V. Furthermore, hpGO showed hole and electron mobilities as high as 11.5 and 12.4 cm(2)V(-1)s(-1), respectively.

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