期刊
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
卷 132, 期 44, 页码 15487-15489出版社
AMER CHEMICAL SOC
DOI: 10.1021/ja1065625
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资金
- Defense Threat Reduction Agency [0743251-0]
- U.S. Dept. of Energy
- Lockheed Martin Corporation
- National Nuclear Security Administration [DE-AC04-94AL85000]
Photoluminescence (PL) spectroscopy was used to characterize nanoscale ZnO impurities, amine-donor charge-transfer exciplexes, and framework decomposition in samples of MOF-5 prepared by various methods. The combined results cast doubt on previous reports describing MOF-5 as a semiconductor and demonstrate that PL as a tool for characterizing MOF purity possesses advantages such as simplicity, speed, and sensitivity over currently employed powder XRD MOF characterization methods.
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