期刊
APPLIED PHYSICS LETTERS
卷 107, 期 2, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4926921
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资金
- Sandia National Laboratories Laboratory Directed Research and Development Program
- U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]
The thermal conductivity of amorphous TaOx memristive films having variable oxygen content is measured using time domain thermoreflectance. Thermal transport is described by a two-part model where the electrical contribution is quantified via the Wiedemann-Franz relation and the vibrational contribution by the minimum thermal conductivity limit for amorphous solids. The vibrational contribution remains constant near 0.9W/mK regardless of oxygen concentration, while the electrical contribution varies from 0 to 3.3 W/mK. Thus, the dominant thermal carrier in TaOx switches between vibrations and charge carriers and is controllable either by oxygen content during deposition, or dynamically by field-induced charge state migration. (C) 2015 AIP Publishing LLC.
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