4.6 Article

Optical and electro-optic anisotropy of epitaxial PZT thin films

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APPLIED PHYSICS LETTERS
卷 107, 期 3, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.4927404

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  1. NTU-A*STAR Silicon Technologies Centre of Excellence [1123510003]
  2. Singapore Ministry of Education Academic Research Fund [MOE2013-T2-2-050]

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Strong optical and electro-optic (EO) anisotropy has been investigated in ferroelectric Pb(Zr0.48Ti0.52)O-3 thin films epitaxially grown on Nb-SrTiO3 (001), (011), and (111) substrates using magnetron sputtering. The refractive index, electro-optic, and ferroelectric properties of the samples demonstrate the significant dependence on the growth orientation. The linear electro-optic coefficients of the (001), (011), and (111)-oriented PZT thin films were 270.8, 198.8, and 125.7 pm/V, respectively. Such remarkable anisotropic EO behaviors have been explained according to the structure correlation between the orientation dependent distribution, spontaneous polarization, epitaxial strain, and domain pattern. (C) 2015 AIP Publishing LLC.

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