期刊
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
卷 130, 期 9, 页码 2762-+出版社
AMER CHEMICAL SOC
DOI: 10.1021/ja711478h
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MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)(2)(Ni0.74Cu0.21Ga0.05)O4+delta.
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