Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor

MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)(2)(Ni0.74Cu0.21Ga0.05)O4+delta.