期刊
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
卷 91, 期 8, 页码 2713-2715出版社
WILEY
DOI: 10.1111/j.1551-2916.2008.02468.x
关键词
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A new ternary layered carbide, ZrAl4C4, has been synthesized and characterized by X-ray powder diffraction. The crystal structure was successfully determined using direct methods and further refined by the Rietveld method. The crystal is trigonal (space group P3m1, Z=2) with lattice dimensions a=0.332471(3) nm, c=2.19717(2) nm, and V=0.210330(3) nm(3). The final reliability indices calculated from the Rietveld refinement were R-wp=6.56% (S=1.58), R-p=4.92%, R-B=1.90%, and R-F=0.98%. The compound shows an intergrowth structure with NaCl-type [Zr2C3] thin slabs separated by Al4C3-type [Al8C7] layers.
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