期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 19, 期 -, 页码 637-646出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049512022637
关键词
photocrystallography; X-ray diffraction; X-ray detection; CCD; Laue method; spot integration; background estimate; statistical analysis; image filtering
资金
- National Science Foundation [CHE0843922]
- National Institutes of Health, National Center for Research Resources [RR007707]
- US Department of Energy, Office of Basic Energy Sciences [W-31-109-ENG-38]
- Direct For Mathematical & Physical Scien
- Division Of Chemistry [1213223, 0843922] Funding Source: National Science Foundation
A spot-integration method is described which does not require prior indexing of the reflections. It is based on statistical analysis of the values from each of the pixels on successive frames, followed for each frame by morphological analysis to identify clusters of high value pixels which form an appropriate mask corresponding to a reflection peak. The method does not require prior assumptions such as fitting of a profile or definition of an integration box. The results are compared with those of the seed-skewness method which is based on minimizing the skewness of the intensity distribution within a peak's integration box. Applications in Laue photocrystallography are presented.
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