4.2 Article

Three-dimensional diffraction mapping by tuning the X-ray energy

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JOURNAL OF SYNCHROTRON RADIATION
卷 18, 期 -, 页码 413-417

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WILEY-BLACKWELL
DOI: 10.1107/S0909049511003190

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X-ray diffraction; nanofocused and microfocused XRD; energy scan; three-dimensional reciprocal-space mapping

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Three-dimensional reciprocal-space maps of a single SiGe island around the Si(004) Bragg peak are recorded using an energy-tuning technique with a microfocused X-ray beam with compound refractive lenses as focusing optics. The map is in agreement with simulated data as well as with a map recorded by an ordinary rocking-curve scan. The energy-tuning approach circumvents both the comparatively large sphere of confusion of diffractometers compared with nanostructures and vibrations induced by motors. Thus, this method offers new possibilities for novel combinations of three-dimensional micro- and nano-focused X-ray diffraction with complex in situ sample environments such as scanning probe microscopes.

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