4.6 Article

Plasma diagnostic approach for high rate nanocrystalline Si synthesis in RF/UHF hybrid plasmas using a PECVD process

期刊

出版社

IOP PUBLISHING LTD
DOI: 10.1088/0963-0252/24/2/025019

关键词

plasma sources; RF/UHF hybrid plasma; plasma diagnostics; PECVD; nc-Si film; hybrid processes

资金

  1. National Research Foundation of Korea (NRF) - Ministry of Science, ICT and Future Planning (MSIP) [2011-0031643]
  2. Korea Institute for the Advancement of Technology (KIAT) - Ministry of Trade, Industry and Energy (MOTIE) [N0000590]

向作者/读者索取更多资源

Hydrogenated nanocrystalline silicon (nc-Si : H) films intended for efficient nc-Si : H solar cells are usually made at the transition to the nanocrystalline regime using the plasma-enhanced chemical vapor deposition (PECVD) process. This change occurs within a sensitive process window and is affected by various deposition parameters. This paper reports a study of nc-Si : H films' fabrication by utilizing systematic plasma diagnostics. This work presents a novel approach for plasma processing using radio frequency (RF), ultra high frequency (UHF) and RF/UHF hybrid plasmas. Using careful analysis, efforts are made to investigate the radicals and plasma formation by changing the operating source power and silane (SiH4) concentration. The aim of this work is also to investigate the PECVD process and conditions favorable for the synthesis of nc-Si : H film. For the present study, we systematically use the optical emission spectroscopy (OES), normal, and RF-compensated Langmuir probe (LP) and vacuum ultraviolet absorption spectroscopy diagnostics. Measurements reveal that the OES diagnostic is consistent with the LP measurements. Investigation reveals that UHF power in addition to RF enables higher dissociation of H or SiH radicals and the production of higher plasma density. The combined effect of both RF and UHF sources is used as the hybrid plasma source. Measurements also reveal that inbetween SiH4 flow rates similar to 20-30 sccm, there is significant change in the plasma characteristics that denotes the nc-Si : H-a-Si : H transition region. An atomic hydrogen density (nH) in the range approximate to (8 - 10) x 10(11) cm(-3) and plasma density n(0) approximate to (2 - 3) x 10(11) cm(-3) with a silane to hydrogen ratio of 1-2% with high crystallinity has been obtained. Along with the discussion on the effect of frequency on plasma chemistry, this explains the RF power coupling and the role of electrons and ions in plasmas with increasing frequency.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据