期刊
JOURNAL OF SOLID STATE CHEMISTRY
卷 184, 期 5, 页码 1025-1035出版社
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jssc.2011.03.015
关键词
Amorphous metal oxides; X-ray absorption; Thin films; XANES; EXAFS; XAFS; Solid-state photochemistry
资金
- US Department of Energy-Basic Energy Sciences
- NSERC
- University of Washington
- Simon Fraser University
- Advanced Photon Source
- U.S. DOE [DE-AC02-06CH11357]
- NSERC-DG
- CFI
- BCKDF
- SFU
The oxidation state and local geometry of the metal centers in amorphous thin films of Fe2O3(Fe3+ oxidation state), CoFe2O4 (Co2+/Fe3+ oxidation states), and Cr2O3 (Cr3+ oxidation state) are determined using K edge X-ray absorption near-edge structure (XANES) spectroscopy and extended X-ray absorption fine structure (EXAFS) spectroscopy. The metal oxide thin films were prepared by the solid-state photochemical decomposition of the relevant metal 2-ethylhexanoates, spin cast as thin films. No peaks are observed in the X-ray diffraction patterns, indicating the metal oxides are X-ray amorphous. The oxidation state of the metals is determined from the edge position of the K absorption edges, and in the case of iron-containing samples, an analysis of the pre-edge peaks. In all cases, the EXAFS analysis indicates the first coordination shell consists of oxygen atoms in an octahedral geometry, with a second shell consisting of metals. No higher shells are observed beyond 3.5 angstrom for all samples, indicating the metal oxides are truly amorphous, consistent with X-ray diffraction results. (C) 2011 Elsevier Inc. All rights reserved.
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