4.6 Article

Defect structure, electronic conductivity and expansion of properties of (La1-xSrx)sCo1-yNiyO3-δ

期刊

JOURNAL OF SOLID STATE CHEMISTRY
卷 183, 期 8, 页码 1853-1862

出版社

ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jssc.2010.04.044

关键词

Electronic conductivity; Lattice expansion; Mobility; Itinerant electron model; Lanthanum strontium cobaltite; Lanthanum strontium cobalt nickel oxide

资金

  1. Danish Research Agency
  2. program committee for Nanoscience and Technology, Biotechnology and Information Technology (NABIIT) [2106-05-0033]

向作者/读者索取更多资源

This study reports on oxygen nonstoichiometry, electronic conductivity and lattice expansion of three compositions as function of T and P-O2 in the (La1-xSrx)(s)Co1-yNiyO3-delta (x=0.1, y=0.4; x=0.1, y=0.3; x=0.2, y=0.2) materials system. The nonstoichiometry data were successfully fitted using the itinerant electron model which indicates the existence of delocalized electronic states. This was also reflected in the high electronic conductivities, above 1000 S cm(-1), measured for all three compositions. The electronic conductivity was shown to decrease linearly with the oxygen nonstoichiometry parameter, delta, supporting that the conductivity is dependent on p-type charge carriers. Comparing calculated p-type mobilities with data reported in literature on La1-xSrxCoO3 indicated that Ni-substitution into (La1-xSrx)(s)CoO3-delta increases the p-type mobility. The electronic conductivity was also found to be dependent on intrinsic charge related to spin excitations and Ni substitution rather than the p-type charge. A conductivity mechanism is hypothesized including a metallic like conductivity of the p-type charge and a small polaron conductivity of the intrinsic charge. Lattice expansion as function of T and delta was successfully described using first and second order thermal and chemical expansion coefficients. Substituting 10% Co with Ni in (La0.6Sr0.4)(0.99)CoO3-delta was found to decrease the apparent thermal expansion with about 25%. (C) 2010 Elsevier Inc. All rights reserved.

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