期刊
JOURNAL OF SOLID STATE CHEMISTRY
卷 181, 期 7, 页码 1670-1677出版社
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jssc.2008.06.036
关键词
electric force microscopy; electrostatic characteristics; nanostructures; nanomaterials
资金
- National Basic Research Program of China [2007CB936800]
- Chinese Academy of Sciences [KJCX2-YW-M04]
- National Science Foundation of China [90406019]
Nanosized materials possess many interesting physical and chemical properties that differ significantly from their macroscopic Counterparts. Understanding the size- and shape-dependent properties of nanostructures are of great value to rational design of nanomaterials with desired functionality. Electric force microscopy (EFM) and its variations offer unique opportunities to deepen our insights into the electrical characteristics of nanostructures. In this paper, we review recent progress of this versatile technique and its applications in studying the electrical properties of nanosized materials. A variety of important issues in EFM experimentation and theoretical modeling are discussed, with an emphasis on the ongoing efforts to improve the precision in quantitative measurements of charge density and dielectric properties of nanostructures. (C) 2008 Elsevier Inc. All rights reserved.
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