期刊
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
卷 51, 期 7, 页码 611-620出版社
WILEY
DOI: 10.1002/polb.23265
关键词
charge transport; crystallization; structure-property relations; thin films; X-ray
资金
- NSF [DMR-1205752]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1205752] Funding Source: National Science Foundation
Using X-ray diffraction-based pole figures, we present quantitative analysis of the microstructure of poly(3-hexylthiophene) thin films of varying thicknesses, which allows us to determine the crystallinity and microstructure at the semiconductor-dielectric interface. We find that the interface is approximately one fourth as crystalline as the bulk of the material. Furthermore, the use of a self-assembled monolayer (SAM) enhances the density of interface-nucleated crystallites by a factor of similar to 20. Charge transport measurements as a function of film thickness correlate with interface crystallinity. Hence, we establish the crucial role of SAMs as nucleating agents for increasing carrier mobility in field-effect devices. (C) 2013 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2013, 51, 611-620
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据