期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 26, 期 36, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/26/36/363201
关键词
RR; XRMR; XMCD; reflectometry; magnetism; exchange bias; superconductors
资金
- German Research Foundation [TRR80]
- Canadian organization NSERC
- Canadian organization CFI
- Canadian organization CRC
- Max-Planck-Society
Measuring the magnetic configuration at complex buried layers and interfaces is an important task, which requires especially a non-destructive probing technique. X-ray resonant magnetic reflectometry (XRMR) combines the non-destructive depth profiling potential of x-ray reflectometry with the excellent sensitivity for magnetic phenomena, utilizing the x-ray magnetic circular dichroism effect. It provides the magnetic spatial distribution with a precision down to the angstrom scale, combined with element and symmetry specificity, sub-monolayer sensitivity, and the possible separation of spin and orbital magnetic moments. This review provides an overview to the XRMR technique in a tutorial way. We focus on the introduction to the theory, measurement types, and data simulation. We provide related experimental examples and show selected applications.
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