4.5 Article

Scattering by linear defects in graphene: a tight-binding approach

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IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/25/7/075303

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资金

  1. Fundacao para a Ciencia e a Tecnologia (FCT) [SFRH/BD/44456/2008]
  2. Fundos FEDER through the Programa Operacional Factores de Competitividade-COMPETE
  3. FCT [PEst-C/FIS/UI0607/2011]
  4. Graphene Research Centre at the National University of Singapore
  5. Fundação para a Ciência e a Tecnologia [SFRH/BD/44456/2008] Funding Source: FCT

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We develop an analytical scattering formalism for computing the transmittance through periodic defect lines within the tight-binding model of graphene. We first illustrate the method with a relatively simple case, the pentagon-only defect line. Afterwards, more complex defect lines are treated, namely the zz(558) and the zz(5757) ones. The formalism developed uses only simple tight-binding concepts, reducing the problem to matrix manipulations which can be easily worked out by any computational algebraic calculator.

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