4.5 Article

Strain dependence of polarization and piezoelectric response in epitaxial BiFeO3 thin films

期刊

JOURNAL OF PHYSICS-CONDENSED MATTER
卷 24, 期 16, 页码 -

出版社

IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/24/16/162202

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资金

  1. French Agence National de Research
  2. European Research Council (ERC) [267579]
  3. ARO [W911NF-12-1-0085]
  4. NSF [DMR-0701558, DMR-1066158]
  5. ONR [N00014-11-1-0384, N00014-08-1-0915, N00014-07-1-0825]
  6. Department of Energy, Office of Basic Energy Sciences [ER-46612]
  7. MRI from NSF [0959124]
  8. HPCMO of the US Department of Defense
  9. Division Of Materials Research
  10. Direct For Mathematical & Physical Scien [1066158] Funding Source: National Science Foundation
  11. Division Of Materials Research
  12. Direct For Mathematical & Physical Scien [GRANTS:14003759] Funding Source: National Science Foundation
  13. EPSCoR
  14. Office Of The Director [0918970] Funding Source: National Science Foundation
  15. EPSCoR
  16. Office Of The Director [GRANTS:13771460] Funding Source: National Science Foundation

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Epitaxial strain has recently emerged as a powerful means to engineer the properties of ferroelectric thin films, for instance to enhance the ferroelectric Curie temperature (T-C) in BaTiO3. However, in multiferroic BiFeO3 thin films an unanticipated strain-driven decrease of T-C was reported and ascribed to the peculiar competition between polar and antiferrodistortive instabilities. Here, we report a systematic characterization of the room-temperature ferroelectric and piezoelectric properties for strain levels ranging between -2.5% and +1%. We find that polarization and the piezoelectric coefficient increase by about 20% and 250%, respectively, in this strain range. These trends are well reproduced by first-principles-based techniques.

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