期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 24, 期 8, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/24/8/084009
关键词
-
资金
- UK Engineering and Physical Sciences Research Council (EPSRC) [EP/G007837]
- Leverhulme Trust [F00/114 BI]
- European Framework 6 training network PATTERNS
- EPSRC [EP/G007837/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/G007837/1] Funding Source: researchfish
We use a noncontact atomic force microscope in the qPlus configuration to investigate the structure and influence of defects on the Si(100) surface. By applying millivolt biases, simultaneous tunnel current data is acquired, providing information about the electronic properties of the surface at biases often inaccessible during conventional STM imaging, and highlighting the difference between the contrast observed in NC-AFM and tunnel current images. We also show how NC-AFM (in the absence of tunnel current) can be used to manipulate both the clean c(4 x 2) surface and dopant-related defects.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据