期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 21, 期 31, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/21/31/314013
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We have used energy-filtered x-ray photoelectron emission microscopy (XPEEM) and synchrotron radiation to measure the grain orientation dependence of the work function of a sintered niobium-doped strontium titanate ceramic. A significant spread in work function values is found. Grain orientation and surface reducing/oxidizing conditions are the main factors in determining the work function. Energy-filtered XPEEM looks ideally suited for analysis of other technologically interesting polycrystalline samples.
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