4.6 Article

Graphene oxide thin film field effect transistors without reduction

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IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/42/13/135109

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  1. Ministry of Education, Science and Technology
  2. KOSEF
  3. WCU (World Class University)
  4. Ministry of Education, Science and Technology [R31-2008-000-10029-0]
  5. National Research Foundation of Korea [2009-0093844, R31-2008-000-10029-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Pristine graphene oxide thin film field effect transistors were fabricated on Si substrates without an additional reduction process. Graphene oxide with an optical band gap of 1.7 eV showed p-type semiconducting behaviour in air and ambipolarity under vacuum. The temperature dependence of conductance confirmed these semiconducting characteristics. I-V characteristics were well fitted to a variable range hopping model with 2 + 3 dimensionality, in good contrast to the 2D fitting in the reduced graphene oxide.

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