期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 42, 期 17, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/42/17/175307
关键词
-
资金
- ECFP7 [217257]
We show that contrast analysis carried out by standard optical microscopy can be employed as a simple and quick technique to monitor the cleanness of graphene during the process steps required for device fabrication. Graphene flakes deposited by adhesive tape exfoliation can display a strong contrast increase upon processing, due to the organic contamination arising from the diffusion of glue residues over the samples. On the other hand, graphene deposited by an adhesive-free method, such as electrostatic deposition, does not show any contrast variation, suggesting a low degree of contamination. Therefore, the fabrication process of graphene-based devices may be monitored and optimized on the basis of an easy optical inspection.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据