期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 41, 期 13, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/41/13/135202
关键词
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When plasma optical spectroscopy is applied to on-line welding quality monitoring, the plasma electronic temperature is commonly selected as the spectroscopic parameter to determine. However, several processing stages have to be considered in this case, including plasma emission line identification, which is significantly costly in terms of computational performance. In this paper, the wavelength associated with the maximum intensity of the plasma background emission is proposed as the new monitoring signal, as it will be demonstrated that there is a clear correlation between this parameter and the welding quality. The resulting processing scheme is clearly simpler, and experimental and field tests will prove the feasibility of the proposed technique.
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