4.2 Article

Multiple ionization of atomic argon irradiated by EUV free-electron laser pulses at 62 nm: evidence of sequential electron strip

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IOP PUBLISHING LTD
DOI: 10.1088/0953-4075/42/22/221003

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  1. Ministry of Education, Culture, Sports, Science and Technology of Japan (MEXT)
  2. Japan Society for the Promotion of Science (JSPS)
  3. IMRAM

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We have investigated multiple ionization of atomic argon by extreme-ultraviolet light pulses (62 nm, 100 fs in width, <2 x 10(14) W cm(-2)) at the free-electron laser facility in Japan, and observed highly charged ions with the charge state up to +6. The measured laser power dependence of the highly charged ions indicates that the multiple ionization proceeds via the sequential stripping of electrons.

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