期刊
JOURNAL OF PHYSICAL CHEMISTRY C
卷 117, 期 43, 页码 22422-22427出版社
AMER CHEMICAL SOC
DOI: 10.1021/jp403177e
关键词
-
资金
- Israel Science Foundation via its centers of Excellence program
- US-Israel Science Foundation
- National Science Foundation [DMR-1005892]
- Wolfson Family Trust
- Kimmel Centre for Nanoscale Science
- Azrieli Foundation
- Weizmann Institute of Science
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1005892] Funding Source: National Science Foundation
The interface level alignment of alkyl and alkenyl monolayers, covalently bound to oxide-free Si substrates of various doping levels, is studied using X-ray photoelectron spectroscopy. Using shifts in the C 1s and Si 2p photoelectron peaks as a sensitive probe, we find that charge distribution around the covalent Si-C bond dipole changes according to the initial position of the Fermi level within the Si substrate. This shows that the interface dipole is not fixed but rather changes with the doping level. These results set limits to the applicability of simple models to describe level alignment at interfaces and show that the interface bond and dipole may change according to the electrostatic potential at the interface.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据