Routes to Probe Strain in ZnO/ZnS Superlattice Nanostructures by X-ray Diffraction

ZnO/ZnS superlattice nanostructures were synthesized via a chemical vapor deposition process. The lattice mismatch between ZnO and ZnS induced defects within the thin superlattice as well as deformations at the interface (junction), which could result in appearance of strain. X-ray diffraction (XRD) is sensitive to very small changes of lattice parameters. The lattice constants of ZnO and ZnS for the ZnO/ZnS superlattice nanostructures and strains were obtained, respectively, on the basis of the XRD pattern. These data are consistent with the observation of high-resolution transmission electron microscopy images.