4.6 Article

Atomic Layer Deposition of Pt on Tungsten Monocarbide (WC) for the Oxygen Reduction Reaction

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JOURNAL OF PHYSICAL CHEMISTRY C
卷 115, 期 9, 页码 3709-3715

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AMER CHEMICAL SOC
DOI: 10.1021/jp111180e

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  1. U.S. Department of Energy [DE-AC05-76RL01830]

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Atomic layer deposition (ALD) was utilized as a synthesis method to deposit monolayers of Pt onto WC substrates for applications as oxygen reduction reaction electrocatalysts. Samples utilizing various Pt ALD cycles were characterized using surface analytical methods and scanning electron microscopy, whereas cyclic voltammetry was used to determine whether the oxygen reduction reaction takes place on the catalyst surface. ALD Pt was found to deposit onto WC substrates following an island growth mechanism. When few Pt ALD cycles are used, discrete Pt particles first formed and dispersed over the WC substrate, but at least 100 ALD cycles is required for the WC substrate to be covered with Pt. Whereas Pt monolayers are not obtained, ALD Pt on WC still shows activity for the oxygen reduction reaction. Cyclic voltammetry conducted in an O-2-saturated 0.5 MH2SO4 electrolyte indicate that as few as 20 Pt ALD cycles on WC is needed to produce oxygen reduction reaction activity that is comparable to Pt bulk. Efforts to make Pt films that are even thinner and more monolayer-like are desired, and potential approaches are discussed.

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