期刊
JOURNAL OF PHYSICAL CHEMISTRY C
卷 112, 期 36, 页码 13856-13861出版社
AMER CHEMICAL SOC
DOI: 10.1021/jp803514h
关键词
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资金
- DFG [IAA 400400804, KAN 200100801, KJB400400601]
- Czech Republic [203/07/J067]
- Czech Ministry of Education, Youth and Sports [LC-510]
- Alexander von Humboldt Foundation
X-ray photoclectron spectroscopy (XPS) was combined with Raman spectroelectrochemistry to study the electrochemically doped states of single wall carbon nanotube (SWCNT) bundles. The ex situ measurements indicated a significant drop of doping level as compared to in situ measurements. However, after this initial decrease of the doping level, the electronic structure of SWCNT bundles was found to be stable. The XPS elemental analysis indicated that electrolyte ions penetrate into the nanotube bundles. Furthermore, for the n-doped (electrochemically reduced) sample, an increase of the relative surface concentration of different C-O groups was observed, which was caused by electrochemical reduction Of ClO4- ions. Comparison of the ex situ Raman and XP spectra showed that an electrode potential shift of I V corresponds to the Fermi level shift of ca. 0.5 eV.
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