期刊
JOURNAL OF NON-CRYSTALLINE SOLIDS
卷 354, 期 19-25, 页码 2843-2848出版社
ELSEVIER
DOI: 10.1016/j.jnoncrysol.2007.09.097
关键词
II-VI semiconductors; nanocrystals; X-ray diffraction; atomic force and scanning tunneling microscopy; scanning electron microscopy; nano-clusters
Controlled growth of ZnO nanorods on various substrates is of great interest in photonic and electronic device applications. Among the various growth techniques developed, wet chemical processes hold great promise as a low cost, low temperature deposition technique. In this study we report properties of ZnO nanorods grown on indium tin oxide coated glass substrates by heating an equimolar solution of zinc (II) nitrate and hexamethylenetetramine solution. The morphology of ZnO nanorods exhibited both open and closed hexagonal shapes under various deposition conditions above 90 degrees C. At 95 degrees C, growth of equimolar ratio of zinc (II) nitrate and hexamethylenetetramine after 4 h examined by scanning electron microscope exhibited mainly open hexagonal structures. The same equimolar ratio at 95 degrees C grown at 9 h and longer duration of chemical bath exhibited closed hexagonal structure. The ratio of the open area of nanorods to the closed surface decreases dramatically as the deposition time is increased from 4 h to 26 h. Peak shape analysis of ZnO nanorods under X-ray diffraction spectrum suggests average crystallite size domains of 200 nanometers. Surface morphology measured using Atomic Force Microscope (AFM) indicates that the 26 h sample is slightly rougher than the 4 h grown ZnO sample. (C) 2008 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据