期刊
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
卷 11, 期 8, 页码 7042-7046出版社
AMER SCIENTIFIC PUBLISHERS
DOI: 10.1166/jnn.2011.4205
关键词
Bismuth Telluride; Optical Contrast; Few-Layer Material; Topological Insulator; Graphene
类别
资金
- National Natural Science Foundation of China [90606002, 11075076, 10775070, 10904065, 11023002]
- National Key Projects for Basic Research of China [2009CB930501, 2010CB923401]
- Program for New Century Excellent Talents in University of China [NCET-07-0422]
Thin Bi2Te3 flakes, with as few as 3 quintuple layers, are optically visualized on the SiO2-capped Si substrates. Their optical contrasts vary with the illumination wavelength, flake thickness and capping layers. The maximum contrast appears at the optimized light with the 570 nm wavelength. The contrast turns reversed when the flake is reduced to less than 20 quintuple layers. A calculation based on the Fresnel law describes the above observation with the constructions of the layer number-wave length-contrast three-dimensional (3D) diagram and the cap thickness-wavelength-contrast 3D diagram, applicative in the current studies of topological insulating flakes.
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