期刊
JOURNAL OF NANOPARTICLE RESEARCH
卷 12, 期 3, 页码 939-949出版社
SPRINGER
DOI: 10.1007/s11051-009-9644-8
关键词
Atomic force microscope; Instrumentation; Nanoparticles; Nanoscale metrology; Size characterization
资金
- U.S. Navy [N00244-06-P-2341, N00244-05-P-2456]
- Pacific Nanotechnology Inc.
Optimal deposition procedures are determined for nanoparticle size characterization by atomic force microscopy (AFM). Accurate nanoparticle size distribution analysis with AFM requires non-agglomerated nanoparticles on a flat substrate. The deposition of polystyrene (100 nm), silica (300 and 100 nm), gold (100 nm), and CdSe quantum dot (2-5 nm) nanoparticles by spin coating was optimized for size distribution measurements by AFM. Factors influencing deposition include spin speed, concentration, solvent, and pH. A comparison using spin coating, static evaporation, and a new fluid cell deposition method for depositing nanoparticles is also made. The fluid cell allows for a more uniform and higher density deposition of nanoparticles on a substrate at laminar flow rates, making nanoparticle size analysis via AFM more efficient and also offers the potential for nanoparticle analysis in liquid environments.
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