期刊
JOURNAL OF MOLECULAR LIQUIDS
卷 192, 期 -, 页码 103-113出版社
ELSEVIER
DOI: 10.1016/j.molliq.2013.07.007
关键词
Ionic liquids; Surface science; X-ray photoelectron spectroscopy XPS; Platinum complexes; Radiation induced and beam damage effects; Surface enrichment and depletion
资金
- DFG [SPP 1191]
- STE [620/7-2, WA 1615/8-2]
- Excellence Cluster Engineering of Advanced Materials
- Max-Buchner-Stiftung
An X-ray photoelectron spectroscopy (XPS) study of Pt(II) and Pt(IV) complexes dissolved in ionic liquids (ILs) revealed the occurrence of a rich redox chemistry, which is partly induced by X-ray radiation. Depending on the IL anion either a reduction of Pt(IV) to Pt(II) in the case of ethylsulfate (IEtOSO3]-)-based ILs, or an oxidation of Pt(II) to Pt(IV) in the case of bis[(trifluoromethyl)sulfonyl]imide ([Tf(2)Nr)-based Its was observed upon X-ray irradiation. Moreover, surface enrichment or depletion effects of the Pt complexes were deduced from angleresolved XPS (ARXPS) data; while the Pt complexes dissolved in imidazolium-based ILs tended to deplete from the surface, in pyrrolidinium-based solutions a surface enrichment of the Pt complexes was observed. (C) 2013 Elsevier B.V. All rights reserved.
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