期刊
JOURNAL OF MICROSCOPY
卷 233, 期 3, 页码 353-363出版社
WILEY
DOI: 10.1111/j.1365-2818.2009.03140.x
关键词
Backscattered electron imaging; conductive glass slides; correlative microscopy; fluorescence light microscopy; indium-tin oxide; mouse embryonic fibroblasts; scanning electron microscopy
类别
资金
- IOP Genomics [IGE05003A2]
A method of direct visualization by correlative scanning electron microscopy (SEM) and fluorescence light microscopy of cell structures of tissue cultured cells grown on conductive glass slides is described. We show that by growing cells on indium-tin oxide (ITO)-coated glass slides, secondary electron (SE) and backscatter electron (BSE) images of uncoated cells can be obtained in high-vacuum SEM without charging artefacts. Interestingly, we observed that BSE imaging is influenced by both accelerating voltage and ITO coating thickness. By combining SE and BSE imaging with fluorescence light microscopy imaging, we were able to reveal detailed features of actin cytoskeletal and mitochondrial structures in mouse embryonic fibroblasts. We propose that the application of ITO glass as a substrate for cell culture can easily be extended and offers new opportunities for correlative light and electron microscopy studies of adherently growing cells.
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