期刊
JOURNAL OF MICROSCOPY
卷 232, 期 1, 页码 99-105出版社
WILEY-BLACKWELL
DOI: 10.1111/j.1365-2818.2008.02075.x
关键词
electro-active polymer (EAP); harmonic excitation light microscopy (HELM); high resolution; structured illumination; wide-field microscopy
类别
Combining total internal reflection fluorescence microscopy with structured illumination allows optical wide-field imaging with sub-100-nanometre resolution. We present a novel objective-launch set-up for standing wave illumination that takes advantage of a tunable transmission diffraction grating and transparent phase shifters actuated by electro-active polymers to control the excitation pattern in three dimensions. Image acquisition is completed in less than 1 s. To reconstruct the extended image spectrum, we apply a new apodization function that results in a lateral resolution of 89 nm for green emission wavelength.
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