4.5 Article

Cyclic Stabilization of Electrodeposited Nickel Structural Films

期刊

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
卷 20, 期 3, 页码 753-763

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JMEMS.2011.2140354

关键词

Fatigue; nickel; thin films

资金

  1. NSF [NSF DMR-0449684, 0335765]
  2. Pennsylvania State University Materials Research Institute NanoFabrication Network
  3. U.S. National Science Foundation [CMS-0528234]
  4. National Nanotechnology Infrastructure Network, Cornell University

向作者/读者索取更多资源

Tensile, room-temperature creep, and fatigue tests were conducted to determine the stability of the mechanical properties of electrodeposited films and to establish a unique strategy to reduce variation in micromachined devices made from them. Microcrystalline nickel films with columnar grains with a typical diameter of less than 1 mu m and nanocrystalline films with 20-nm equiaxed grains were evaluated. While the tensile strengths of the films were higher than bulk forms of the material, the strength, strain to failure, and apparent elastic modulus were highly variable. Creep tests revealed that the films accumulated plastic strain rapidly at room temperature and that the apparent elastic modulus increased after exposure to stress. However, the response of the film was sensitive to the local deposition conditions. Fortunately, incremental-step fatigue tests demonstrated that the films cyclically hardened and that further changes in the elastic and plastic deformation responses do not occur after cyclic stabilization. As a result, cyclic stress strain curves and the transient stabilization behavior can be used to define a mechanical burn-in sequence for electrodeposited nickel films that will improve the stability and reproducibility of micromachined devices. [2010-0206]

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据