期刊
JOURNAL OF MATERIALS RESEARCH
卷 23, 期 4, 页码 1064-1067出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1557/JMR.2008.0124
关键词
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Crystallographic ordering and defects in WSe(2) thin films with ultralow thermal conductivity are characterized by electron imaging and diffraction in cross-sectional geometry. The results show that the film consists of oriented, coherent crystallites that are a few nanometers in diameter. Two films of different thickness with different thermal conductivity are compared. We show that the film with a lower thermal conductivity is characterized by less coherent crystallites with a greater degree of misorientation.
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