4.6 Article

Structural and photoluminescence characterization of SnO2: F thin films deposited by advanced spray pyrolysis technique at low substrate temperature

期刊

JOURNAL OF LUMINESCENCE
卷 139, 期 -, 页码 113-118

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.jlumin.2013.01.021

关键词

Fluorine doped tin oxide; Thin films; Substrate temperature; Photoluminescence

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资金

  1. University Grants Commission New Delhi (UGC) through UGC major research project
  2. UGC under the UGC-NON-SAP Programme
  3. Department of Science and Technology (DST), Government of India, New Delhi through DST-PURSE 360 Scheme

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Fluorine doped tin oxide (FTO) thin films were deposited on glass substrates, at different substrate temperatures using advanced spray pyrolysis technique. X-ray diffraction studies showed that the crystallinity of the thin films increased with increasing substrate temperature. FESEM and AFM studies support the conclusions drawn from X-ray diffraction studies. X-ray photoelectron studies confirm oxygen deficiency in formation of the FTO nanocrystallites. The photoluminescence of the FTO films were investigated. It was found that, room temperature photoluminescence spectra are dominated by oxygen vacancies and exhibit a rich violet photoluminescence band about similar to 404 rim with an extensively feeble red emission about 700 nm. The Photoluminescence intensity varies with the substrate temperature. The photoemission position is observed to be independent of substrate temperature. (C) 2013 Elsevier B.V. All rights reserved.

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