期刊
JOURNAL OF INSTRUMENTATION
卷 3, 期 -, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1748-0221/3/12/P12004
关键词
Interaction of radiation with matter; Photoemission; Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); X-ray diffraction detectors
资金
- E.U. FP6 program [STRP 505634-1]
- Portuguese Foundation for Science and Technology
The in situ combination of Scanning Probe Microscopies with X-ray microbeams adds a variety of new possibilities to the panoply of synchrotron radiation techniques. This paper describes an optics-free Atomic Force Microscope that can be directly installed on most of the synchrotron radiation end-stations for combined X-ray and atomic force microscopy experiments. The instrument can be used for atomic force imaging of the investigated sample or to locally measure the X-ray absorption or diffraction, or it can also be used to mechanically interact with the sample while simultaneously taking spectroscopy or diffraction measurements. The local character of these measurements is intrinsically linked with the use of the Atomic Force Microscope tip. It is the sharp tip that gives the opportunity to measure the photons flux impinging on it, or to locally measure the absorption coefficient or the shape of the diffraction pattern. At the end an estimation of the limits of the various techniques presented is also discussed.
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