4.6 Article

High-reflectance La/B-based multilayer mirror for 6.x nm wavelength

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OPTICS LETTERS
卷 40, 期 16, 页码 3778-3781

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OPTICAL SOC AMER
DOI: 10.1364/OL.40.003778

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  1. ASML
  2. Carl Zeiss SMT AG
  3. Demcon
  4. Foundation for Fundamental Research on Matter (FOM)
  5. Industrial Focus Group XUV Optics
  6. PANalytical
  7. Province of Overijssel
  8. SolMates
  9. TNO
  10. University of Twente

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We report a hybrid thin-film deposition procedure to significantly enhance the reflectivity of La/B-based multilayer structures. This is of relevance for applications of multilayer optics at 6.7-nm wavelength and beyond. Such multilayers showed a reflectance of 64.1% at 6.65 nm measured at 1.5-degrees off-normal incidence at PTB (BESSY-II). This was achieved by a special scheme of La passivation. The La layer was nitridated to avoid formation of the optically unfavorable LaBx compound at the B-on-La interface. To avoid the also undesired BN formation at the La-on-B interface, a time-dosed nitridation at the initial stage was applied. This research revealed a good potential for further increase in the reflectivity of multilayer structures at 6.7 nm. (C) 2015 Optical Society of America

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