Soft X-ray Emission Optimization Studies with Krypton and Xenon Gases in Plasma Focus Using Lee Model

The X-ray emission properties of krypton and xenon plasmas are numerically investigated using corona plasma equilibrium model. Numerical experiments have been investigated on various low energy plasma focus devices with Kr and Xe filling gases using Lee model. The Lee model was applied to characterize and to find the optimum combination of soft X-ray yields (Y-sxr) for krypton (similar to 4 a<<) and xenon (similar to 3 a<<) plasma focus. These combinations give Y-sxr = 0.018 J for krypton, and Y-sxr = 0.5 J for xenon. Scaling laws on Kr and Xe soft X-ray yields, in terms of storage energies E-0, peak discharge current I-peak and focus pinch current I-pinch were found over the range from 2.8 to 900 kJ. Soft X-ray yields scaling laws in terms of storage energies were found to be as and for Kr and Xe, respectively, (E-0 in kJ and Y-sxr in J) with the scaling showing gradual deterioration as E-0 rises over the range. The maximum soft X-ray yields are found to be about 0.5 and 27 J from krypton and xenon, respectively, for storage energy of 900 kJ. The optimum efficiencies for soft X-ray yields (0.0002 % for Kr) and (0.0047 % for Xe) are with capacitor bank energies of 67.5 and 225 kJ, respectively.