期刊
JOURNAL OF ELECTROSTATICS
卷 70, 期 5, 页码 445-450出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elstat.2012.06.004
关键词
Arabidopsis thaliana; Full-wave analysis; Leaf area; High-intensity nanosecond pulsed electric fields
资金
- Faculty of Engineering at Mahidol University, Thailand
Arabidopsis thaliana seeds were subjected to nanosecond pulsed electric field (nsPEF) to examine the growth effect. The exposures were carried out using electrical pulses of 10 ns duration with the field intensity varied from 5 to 20 kV cm(-1). Statistical analysis on the average leaf area showed that the positive nsPEF effect appeared a few days after germination. It was also found that the effect was significant the second week following treatments, especially at 10 kV cm(-1) with a maximum increase of 80% compared to the control (P < 0.01). (c) 2012 Elsevier B.V. All rights reserved.
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