期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 185, 期 3-4, 页码 112-118出版社
ELSEVIER
DOI: 10.1016/j.elspec.2012.01.004
关键词
X-ray photoelectron spectroscopy; Ar ion bombardment; Ion-induced reduction; Tungsten oxide
类别
资金
- National Natural Science Foundation of China [51072236, 21106190]
- Department of Education and Department of Science and Technology of Guangdong Province [1051027501000094]
- Ministry of Education of China [20100171120022]
- Research Foundation of Instrumental Analysis & Research Center of Sun Yat-Sen University [IARC 2009005, IARC 2010002]
- Analysis Foundation of Guangzhou Scientific Instrument Network [201003]
- Foshan Research Project [2011BC100023]
WO3 nanowire film was bombarded by Ar ion beam in the analysis chamber of an X-ray photoelectron spectroscopy (XPS) system to produce uniform tungsten cone arrays. The WO3 nanowire film itself served as an etching mask during the Ar+ bombardment. The changes of surface chemical states and electronic structures during bombardment were monitored by in situ XPS. The morphological evolution with different Ar+ bombardment time was observed by ex situ scanning electron microscopy (SEM). At the start of Ar+ bombardment partial W6+ in WO3 was reduced to W5+ immediately, subsequently to W4+ and then to Wx+ (intermediate chemical state between W4+ and W-0), finally to W-0. Multiple oxidation states of tungsten coexisted until finally only W-0 left. SEM images showed that the nanowires were broken and then fused together to be divided into clusters with a certain orientation after long-time high-energy ion beam bombardment. The mechanism of the ion-induced reduction during bombardment and the reason of the orientated cone arrays formation were discussed respectively. (C) 2012 Elsevier B.V. All rights reserved.
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